Test and Analysis of High-Performance Microprocessor Through Power Binning Method
S. Rooban1, K. Sarath Kumar2, K. Ravi Shankar3, N. Udaya Bhaskara Rao4
1S. Rooban, Department of Electronics and Communication Engineering, K L University, Vijayawada (A.P ), India.
2N. Udaya Bhaskara Rao, Department of Electronics and Communication Engineering, K L University, Vijayawada (A.P ), India.
3K .Ravi Shankar, Department of Electronics and Communication Engineering, K L University, Vijayawada (A.P ), India.
4K. Sarath Kumar, Department of Electronics and Communication Engineering, K L University, Vijayawada (A.P ), India.
Manuscript received on 18 April 2019 | Revised Manuscript received on 25 April 2019 | Manuscript published on 30 April 2019 | PP: 882-886 | Volume-8 Issue-4, April 2019 | Retrieval Number: D6228048419/19©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Structuring superior frameworks with high return under parameter varieties has brought genuine plan difficulties up in nanometer innovations. With expanding process variety, binning has turned into a vital method to improve the estimations of manufactured chips, particularly in elite microchips where straightforward locks are broadly utilized. In this examination, we center around self-testing and execution binning. We make the accompanying commitments. To begin with, we propose a Built in self-testing strategy , in manufacture of a chip diverse parameters changes in execution of microchip distinctive outstanding burdens contrast for various items (PCs, mobile’s….etc.). BIST basically comprises of straight criticism move register square and different information signature register square (yield reaction compactor). At that point, an execution binning strategy dependent on basic at-speed defer testing is created for strong frameworks to incredibly spare the binning cost, and a versatile clock arrangement method is proposed for yield improvement.
Keywords: BIST, LFSR, MISR
Scope of the Article: Test Automation