Efficient Hard Decision Fault Diagnosis using Scan Based Testing in Sequential Circuits
S.Vimal Raj1, E. Nandha Kumar2, V. S. Sanjana Devi3, C. Sakthivel4, K. Rajangam5
1S.Vimalraj, Department of Electrical and Electronics, Sri Krishna College of Tehcnology, Coimbatore (Tamil Nadu), India.
2E. Nandhakumar, Department of Electrical and Electronics, Sri Krishna College of Tehcnology, Coimbatore (Tamil Nadu), India.
3V. S. Sanjanadevi, Department of Electrical and Electronics, Sri Krishna College of Tehcnology, Coimbatore (Tamil Nadu), India.
4C. Sakthivel, Department of Electrical and Electronics, Sri Krishna College of Tehcnology, Coimbatore (Tamil Nadu), India.
5K. Rajangam, Department of Electrical and Electronics, Sri Krishna College of Tehcnology, Coimbatore (Tamil Nadu), India.
Manuscript received on 15 December 2019 | Revised Manuscript received on 22 December 2019 | Manuscript Published on 31 December 2019 | PP: 103-107 | Volume-9 Issue-1S6 December 2019 | Retrieval Number: A10191291S619/19©BEIESP | DOI: 10.35940/ijeat.A1019.1291S619
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Testing in sequential circuits is extremely difficult because behavior of sequential circuits depends on both the present and past value. Nowadays, in memory applications even single bit changes in digital circuits results in serious error. This paper presents a fault-detection method for difference-set test patterns with efficient hard decision algorithm using majority logic decoder/detector. This algorithm has the ability to correct large number of faults. The proposed checksum method for fault detection and correction significantly reduces testing time. This technique doesn’t require appending parity bits, which makes the area overhead minimal and keeps the extra power consumption low.
Keywords: Scan Based Testing, Majority Logic Decoder, Hard Decision Algorithm, Parity Check Bits, Error Correction Codes, Memory.
Scope of the Article: Sequential, Parallel and Distributed Algorithms and Data Structures