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An Improvement to a Class of Intensity based Spatial Domain Corner Detection Algorithms using Image Fission and Fusion
Ambar Dutta

Ambar Dutta, Amity Institute of Information Technology, Amity University, Kolkata, India.

Manuscript received on November 25, 2019. | Revised Manuscript received on December 15, 2019. | Manuscript published on December 30, 2019. | PP: 924-930 | Volume-9 Issue-2, December, 2019. | Retrieval Number:  A2028109119/2020©BEIESP | DOI: 10.35940/ijeat.A2028.129219
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: Corners of an object are important as features for the representation and analysis of its shape in computer vision. Corner detection, particularly in real scenes, is still a challenge. Most of the corner detectors found in the literature generate a number of false corners, which is not acceptable in real-life applications. In this paper, an improvement to a class of corner detection algorithms is presented using image fission/fusion. In this approach, a grayscale image is first divided into several bit-planes. A corner detector is applied on all the bit-planes simultaneously and a threshold (bitplane) is obtained using the concept of information gain. Finally, all the higher bit-plane corners are recombined (up to some thresholded bit-plane) to obtain the final set of corners. Here the corner detection algorithm is considered as a binary classification problem. Experimental results show that this improved approach reduces the number of erroneous corner detection relative to existing spatial domain corner detection algorithms. The improvements are established with the help of a number of performance measures proposed by various researchers. The proposed approach works better with respect to computational time also. This approach can easily be utilized in different low-level image processing applications.
Keywords: Corner detection, Bit plane decomposition, information gain, Threshold, Non-maximum suppression, Performance measure.