A Comparative Study on Genetic Algorithm and Ant Colony Algorithm for Testing S27 Benchmark Cyclic Sequential Circuits
J.Poornimasre1, R.Harikumar2, P.Saravanakumar3
1Mrs. J.Poornimasre, Assistant Professor, Level II, Department of Electronics & Communication Engineering, Bannari Amman Institute of Technology, Sathyamangalam (Tamil Nadu), India.
2Dr. R.Harikumar, Professor, Department of Electronics & Communication Engineering, Bannari Amman Institute of Technology, Sathyamangalam (Tamil Nadu), India.
3Mr. P.Saravanakumar, Assistant Professor, Level II, Department of Electronics & Communication Engineering, Bannari Amman Institute of Technology, Sathyamangalam (Tamil Nadu), India.
Manuscript received on 13 December 2018 | Revised Manuscript received on 22 December 2018 | Manuscript Published on 30 December 2018 | PP: 33-38 | Volume-8 Issue-2S, December 2018 | Retrieval Number: 100.1/ijeat.B10161282S18/18©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Testing is the procedure of evaluating the performance of the system with the intent to find whether the system meets its functional requirements or not. The testing procedure involves testing a predefined sets of input test data to the circuit under test (CUT) and determining the circuit responses. CUT that gives the exact output responses for all input stimuli that passes the test are said to be fault-free circuits. These failed circuits will give an exact response at any given point during the test sequence are assumed to be faulty. VLSI Testing will be done at different life cycle stages of a VLSI device, that includes the VLSI development process, the electronic system manufacturing process, and, in some cases, system-level operation. Several algorithm are exists to improve the test performance of a system also reduce the testing time. A performance analysis of Genetic algorithm and Ant colony algorithm has been carried out on S27 benchmark cyclic sequential circuits. Results shows that Genetic algorithm detects more faults with minimal number of test pattern than the Ant colony algorithm with less complexity.
Keywords: Test Vectors, Fault Detection, Controllability & Observability, S27 Benchmark Circuits, Cycle Detection, Genetic Algorithm.
Scope of the Article: Parallel and Distributed Algorithms