Automated Defect Inspection Algorithm Incorporated Spectral-Domain Optical Coherence Tomography for Optical Polarizing Thin Films
Byeonggyu Jeon1, Youngmin Han2, Ruchire Eranga Wijesinghe3, Mansik Jeon4, Jeehyun Kim5
1Youngmin Han, Department of Nuclear Energy Convergence, Kyungil University, Gyeongsan-si, Gyeongbuk, Korea.
2Byeonggyu Jeon, School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Buk-gu, Daegu, Korea.
3Ruchire Eranga Wijesinghe, Department of Biomedical Engineering, College of Engineering, Kyungil University, Gyeongsan, Korea.
4Mansik Jeon*, School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Buk-gu, Daegu 41566, Korea.
5Jeehyun Kim, School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Buk-gu, Daegu, Korea,
Manuscript received on February 06, 2020. | Revised Manuscript received on February 10, 2020. | Manuscript published on February 30, 2020. | PP: 1362-1365 | Volume-9 Issue-3, February, 2020. | Retrieval Number: C5515029320/2020©BEIESP | DOI: 10.35940/ijeat.C5515.029320
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Optical polarizing thin film is an optical filter enables light waves of a specific polarization pass through while blocking light waves of other polarizations. Optical polarizing thin films control the brightness of back-light unit for LCD (liquid crystal display) panel, which is essential to produce LCD modules. Defect inspection of polarizing thin films is an important feature during the manufacturing process that is helpful to improve the product quality. In the current study, an automated defect inspection algorithm is introduced and incorporated with a well-known non-destructive and non-contact optical inspection method called spectral domain optical coherence tomography (SD-OCT) to pre-identify defective sub-surface as well as top-surface locations of optical polarizing thin films Polarizing thin films employed in this study consist of 6 layers. The tomographic information, layer information, and defective locations were sufficiently identified through the SD-OCT system owing high-axial resolution. The acquired results indicate the possible application of the proposed system in optical polarizing thin films for the quality assurance.
Keywords: SD-OCT, optical polarizing thin film, defect inspection, optical inspection.