Accelerated Life Testing of Ceramic Capacitors and Integration of its Reliability Test Data with PLM Solutions
Kalaiselvan C1, Arun Prakash R2
1Kalaiselvan C, Department of Production Engineering, PSG College of Technology, Coimbatore, South, India.
2PArun Prakash R, Department of Production Engineering, PSG College of Technology, Coimbatore, South, India.
Manuscript received on March 02, 2013. | Revised Manuscript received on April 13, 2013. | Manuscript published on April 30, 2013. | PP: 305-309 | Volume-2, Issue-4, April 2013. | Retrieval Number: D1434042413/2013©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: As the market for an electronic device continues to grow and expand, it has become evident that product reliability must remain a top priority for electronic device manufacturers. The Electronic Device manufacturing industry is now under increasing pressure to maintain their places in the market. To improve their ability to innovate, get products to market faster, and reduce errors, the manufacturers have been continuing to improve their product reliability and product development. time. Product reliability is considered as a prime contributor to quality and competitiveness. The reliability of the product is usually determined by testing the product to failure and collection of time to failure (TTF) data. For some products the test time to evaluate reliability is usually very longer, if it is tested under actual working condition of the products. Hence the accelerated and highly accelerated life testing (HALT) testing method is employed to accelerate to stress condition on the product to quicken the degradation of products performance. The obtained performance data when analyzed, yields its reasonable estimates of products life under actual conditions. In this study, the ceramic capacitor are evaluated for it reliability using HALT. The capacitors are considered to be failed when its insulation resistance dropped. The product lifecycle management (PLM) integration methodology adopted in this study is based on 3-tier client server architecture. The software tool like Java, HTML (Hyper Text Markup Language) and SQL (Structured query language) are used to create the front and back end 3-tier architecture.
Keywords: Highly Accelerated life Testing, Time to Failure (TTF), Product Lifecycle Management (PLM), Server Architecture.