FPGA Implementation for Integrated Circuit Technology Tester
Suhas S1, Abhishek Joshi2, Ravi Srinivas3, Nagarjun C S4
1Suhas S, Student, Department of Electronics and Communication, RNSIT, Bangalore (Karnataka), India.
2Abhishek Joshi, Student, Department of Electronics and Communication, RNSIT, Bangalore (Karnataka), India.
3Ravi Srinivas,Student, Department of Electronics and Communication, RNSIT, Bangalore (Karnataka), India.
4Nagarjun.C.S, Student, Department of Electronics and Communication, RNSIT, Bangalore (Karnataka), India.
Manuscript received on 15 April 2016 | Revised Manuscript received on 25 April 2016 | Manuscript Published on 30 April 2016 | PP: 17-19 | Volume-5 Issue-4, April 2016 | Retrieval Number: D4465045416/16©BEIESP
Open Access | Editorial and Publishing Policies | Cite | Mendeley | Indexing and Abstracting
© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Integrated Circuits have dominated every walk of life in the present world. In this Integrated Circuit era, the need of testing of ICs has become the need of the hour. The implementation and fabrication of new ICs on a daily basis have brought testing to new heights. Albeit these requirements, not many efficient, cheap and readily available testing solutions have been realized. In the following paper, a simple yet highly effective solution to various testing concerns of digital circuits or ICs along with its implementation has been brought out. The real time results got are validated and are readily available for verification of the design under test.
Keywords: Digital Designs, Field Programmable Gate Array [FPGA], Testing
Scope of the Article: FPGAs