Design of Low Power C-Element Based Dual Data Rate Flip-Flip 
Shaik Haneef1, S. Arunmetha2
1Shaik Haneef*, Department of Electronics and Communication Engineering, K L University Green Fields, Vaddeswaram, Andhra Pradesh, India.
2S. Arunmetha, Associate Professor, Department of Electronics and Communication Engineering, K L University Green Fields, Vaddeswaram, Andhra Pradesh, India.
Manuscript received on May 29, 2020. | Revised Manuscript received on June 22, 2020. | Manuscript published on June 30, 2020. | PP: 672-675 | Volume-9 Issue-5, June 2020. | Retrieval Number: E9245069520/2020©BEIESP | DOI: 10.35940/ijeat.E9245.069520
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Fulfillment of dual edge flip-flops gets freshly develops into the goal of countless exploration to sustain expressive accomplishment of digital schemes while compressing power expenditure. Powerful low-power flip-flops acquire absolute basic district elements Gross sudden width of histrionic organizes successive circumferences / circuits. Conclude individually and remarkable testing as long as their vulnerability, Q-Delay, Rise Time Path, Fall Time Path and Average Power Consumption. While Power reveals smart effective count regarding the latest electrifying circuit transistors, uncertainly we survive balancing, including scheming comic numbers such as transistors that suspense each number of flip-flops. Analysis / inquiry on static / stable circuits is performed by Dual Data Rate (DDR) using PTM CMOS-16 nm technology alongside 5MHZ frequencies, including their victory procedure. Sensational Dual Data Rate (DDR) Flip-Flop uses 30% less capacity / power, including 14% lower C-Q delay. This paper’s proposed architecture is to analyze logic size, area, and power consumption using tanner tool.
Keywords: Flip-Flop, C-Element, Rise path and fall path, D to Q Delay and Average power Consumption.