BIST for Reconfigurable System on Chip (SOC) for Micro-Vibration Measurement
Karthik. B1, Philomina.S2, Jasmine. M3
1Karthik B, Assistant Professor, Department of Electronics and Communication Engineering, Bharath Institute of Higher Education and Research, Chennai (Tamil Nadu), India.
2Philomina S, Assistant Professor, Department of Electronics and Communication Engineering, Bharath Institute of Higher Education and Research, Chennai (Tamil Nadu), India.
3Jasmine M, Assistant Professor, Department of Electronics and Communication Engineering, Bharath Institute of Higher Education and Research, Chennai (Tamil Nadu), India.
Manuscript received on 13 September 2019 | Revised Manuscript received on 22 September 2019 | Manuscript Published on 10 October 2019 | PP: 67-70 | Volume-8 Issue-6S2 August 2019 | Retrieval Number: F10900886S219/19©BEIESP | DOI: 10.35940/ijeat.F1090.0886S219
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: This paper presents methodology for testing mixed signal circuits in the SOC configured for micro vibration measurement. The SOC for micro vibration measurement contains a Bi morph sensor and front end electronics containing an amplifier, peak detector interface with A/D converter and memory. The amplifier is tested by applying triangular stimuli input generated by Test Pattern Generator (TPG) configured in the FPGA. The peak detector is tested by applying a test pulses generated by test generator system. The outputs of the test circuit are analyzed by output response analyzer (ORA) in the FPGA. The required hardware for testing analog as well as digital circuits of the SOC are configured by the on chip portion of FPGA and FPAA. The whole SOC can be tested by applying stimuli generated in TPG and checking the output by comparing patterns stored in memory with reference pattern using ORA. Simulation results are reported for counter and test ADC.
Keywords: Output Response Analyzer, Test Pattern Generator, Soc and FPAA.
Scope of the Article: Microwave Photonics