Digital Image Processing Technique in Laser Speckle Pattern Interferometer for Phase Evaluation
R. Balamurugan1, S. Muruganand2
1R. Balamurugan, Kumaraguru College of Technology, Dept. of Physics, Coimbatore, India.
2S. Muruganand, Dept. of Electronics & Instrumentation, Bharathiyar University, Coimbatore, India.
Manuscript received on January 22, 2013. | Revised Manuscript received on February 10, 2013. | Manuscript published on February 28, 2013. | PP: 560-562 | Volume-2 Issue-3, February 2013. | Retrieval Number: C1202022313/2013©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: In this paper, Electronic laser speckle pattern technique has been adopted to measure small deformation/displacement of a specimen. A low cost Laser Speckle Interferometer has been designed with minor modification of Michelson Interferometer. Laser speckle images are recorded before the deformation (reference image) and then after deformation. By simple subtraction of the digital speckle images, a fringe pattern obtained using image processing technique. It gives information about the displacement by means of its phase evaluation.
Keywords: Laser speckle, Image Subtraction, Displacement, deformation.